The Perkin Elmer 400 Series Spectrometer is a dual range bench top FT-IR instrument. Its fully optimized performance is achieved by the provision of dual sources, dual beamsplitters and dual detectors.
For the MIR Configuration:
The optical system enables you to collect data over a total range of 7800 to 370cm-1 with a best resolution of 0.5cm-1
It is fitted with an MCT (Mercury Cadmium Telluride) detector.
For the NIR Configuration:
The optical system enables you to collect data over a total range of 15000 to 1250cm-1 with a best resolution of 0.5cm-1.
An NIR DTGS (Deuterated Triglycine Sulphate) detector is fitted.
The instrument can operated in ratio, single beam and interferogram mode.
The PerkinElmer Spotlight 400 is an infrared imaging system allowing large sample areas to be analyzed in minutes and seconds rather than hours.
Its high sensitivity allows the smallest samples to be detected, while its IR imaging speed improves problem-solving time as well as redefines maximum measurement areas, revealing information not previously available thus extending IR analysis to many new applications with 6.25 Ám and 25 Ám pixel resolution.
There are also a number of accessories available for the system including a Universal ATR which fits directly into the sample compartment for easy analysis of liquid samples and surface coatings.
We also have an ATR Imaging accessory (Germanium crystal with a refractive index of 4.0) which enables collection of ATR images from a sample area that has been visually identified using the microscope. The accessory includes a mini stage to aid precise sample positioning. Also to ensure good optical contact during data collection, the accessory includes a mechanism that applies a consistent and controllable compressive force between the sample and the ATR crystal via the anvil.
The range of measurement of the accessory allows you to collect data over a total range of 4500cm-1 - 720cm-1 (ATR Imaging Mode) with a spatial resolution of 3.1Ám at the centre of field.